MarSurf M 400
Description
- Profile determination: Primary, waviness and roughness profile
- Probes: Inductive skidless tracing system with exchangeable probe inserts, 2 μm probe arms, measuring force approx. 0.7 mN (standard)
- Standards DIN/ISO/JIS/ASME/MOTIF
- Traversing lengths Lt as per DIN EN ISO / JIS: 1.75 mm, 5.6 mm, 17.5 mm automatic, free entry (0.07 inc, 0.22 in, 0.7 in) as per MOTIF: 1 mm, 2 mm, 4 mm, 8 mm, 12 mm, 16 mm
- Evaluation lengths lm (as per ISO/JIS) 1.25 mm, 4.0 mm, 12.5 mm
- Number n of sampling lengths (as per ISO/JIS): selectable
- Automatic selection of filter and tracing length according to standards
- Gaussian filter (as per DIN/JIS), Ls filter Standards DIN/ISO/JIS/ASME/MOTIF
- Cutoff lc (as per ISO/JIS): 0.25 mm, 0.8 mm, 2.5 mm, automatic, (0.010 in, 0.032 in, 0.100 in)
- Short cutoff (as per ISO/JIS) selectable
- Measuring speed 0.2 mm/s; 1 mm/s
- Profile resolution measuring range: ±250 μm = 8 nm, ±25 μm = 0.8 nm
- 15 languages, 3 of them Asian
- Parameters as per: DIN/ISO: Ra, Rq, Rz, Rmax, Rp, Rv, Rpk, Rk, Rvk, Mr1, Mr2, A1, A2, Vo, Rt, R3z, RPc, Rmr (3x), HSC, RSm, Rsk, Rdc, Rdq, Rkn, Pa, Pt, Pmr (3x), Pdc, Wa, Wq, Wt, WSm, Wsk, JIS: Ra, Rz, RzJIS94, Sm, S
- ASME: RpA, Rpm
- MOTIF: R, Ar, Rx, W, Wx, Wte, CR, CL, CF, NR, NCRX, NW, CPM
- Printing of R-profile (ISOASME//JIS), P-profile (MOTIF), material ratio curve, result record
- Date and/or time of measurement
- Integrated memory for results of up to approx. 40,000 measurements and 30 profiles
- Dynamic calibration function
- Lock/code number protection for unit settings
